• DocumentCode
    3497766
  • Title

    The NanoBox project: exploring fabrics of self-correcting logic blocks for high defect rate molecular device technologies

  • Author

    Kleinosowski, Aj ; Lilja, David J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Minnesota Univ., USA
  • fYear
    2004
  • fDate
    19-20 Feb. 2004
  • Firstpage
    19
  • Lastpage
    24
  • Abstract
    Trends indicate that emerging process technologies, including molecular computing, experiences an increase in the number of noise induced errors and device defects. In this paper, we introduce the NanoBox, a logic lookup table bit string. In this way, we contain and self-correct errors within the lookup table, thereby presenting a robust logic block to higher levels of logic design. We explore five different NanoBox coding techniques. We also examine the cost of implementing two different circuit blocks using a homogeneous fabric of NanoBox logic elements: 1) a floating point control unit from the IBM Power4 microprocessor and 2) a four-instruction ALU. In this initial investigation, our results are not meant to draw definitive conclusions about any specific NanoBox implementation, but rather to spur discussion and explore the feasibility of fine-grained error correction techniques in molecular computing systems.
  • Keywords
    error correction codes; fault tolerant computing; logic design; logic gates; microprocessor chips; molecular electronics; table lookup; IBM Power4 microprocessor; NanoBox coding techniques; NanoBox logic elements; NanoBox project; circuit blocks; device defects; fine-grained error correction techniques; floating point control unit; four-instruction ALU; high defect rate molecular device technologies; homogeneous fabric; logic design; lookup table; molecular computing systems; noise induced errors; process technologies; robust logic block; self-correct errors; self-correcting logic blocks; Costs; Fabrics; Logic circuits; Logic design; Logic devices; Microprocessors; Molecular computing; Nanoscale devices; Noise robustness; Table lookup;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 2004. Proceedings. IEEE Computer society Annual Symposium on
  • Print_ISBN
    0-7695-2097-9
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2004.1339503
  • Filename
    1339503