Title :
Sol-gel derived bulk acoustic wave devices for cellular communication applications
Author :
Awang, Zaiki ; Miles, R.E. ; Milne, S.J. ; Tu, Y.L.
Author_Institution :
Inst. Technol. MARA, Jabatan Kejuruteraan Elektrik, Malaysia
Abstract :
This paper reports recent advances obtained with bulk acoustic wave resonators fabricated using sol-gel thin film transducers. Acoustic resonances in the uhf/lower microwave region have been observed with unloaded Q values of the order of 800-1000. The resonator characteristics were found to be improved with poling. The relative permittivity of the films were observed to decrease with frequency, an effect we believe is due to relaxation associated with domain switching. On-wafer input impedance measurements were carried out using cascade Microtech high frequency probes in conjunction with an HP8510C network analyzer. The effects of parasitics at high frequencies were minimized using an on-wafer calibration scheme which was verified using impedance standards supplied by the probe manufacturer and also with verification elements realized on the sol-gel films themselves
Keywords :
MMIC; Q-factor; UHF devices; acoustic resonators; bulk acoustic wave devices; calibration; cellular radio; lead compounds; microwave devices; permittivity; piezoceramics; piezoelectric thin films; sol-gel processing; thin film devices; BAW resonators; HP8510C Network Analyzer; MMIC compatibility; PZT; PbZrO3TiO3; Q values; Si; UHF region; acoustic resonances; bulk acoustic wave devices; cascade Microtech high frequency probes; cellular communication applications; domain switching; lower microwave region; onwafer calibration scheme; onwafer input impedance measurements; parasitics; poling; relative permittivity; relaxation; resonator characteristics; sol-gel thin film transducers; Acoustic devices; Acoustic transducers; Acoustic waves; Bulk acoustic wave devices; Frequency; Microwave devices; Permittivity; Probes; Resonance; Transistors;
Conference_Titel :
Semiconductor Electronics, 1996. ICSE '96. Proceedings., 1996 IEEE International Conference on
Conference_Location :
Penang
Print_ISBN :
0-7803-3388-8
DOI :
10.1109/SMELEC.1996.616490