• DocumentCode
    3498431
  • Title

    Litho-aware and low power design of a secure current-based physically unclonable function

  • Author

    Kumar, Ravindra ; Burleson, Wayne

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts Amherst, Amherst, MA, USA
  • fYear
    2013
  • fDate
    4-6 Sept. 2013
  • Firstpage
    402
  • Lastpage
    407
  • Abstract
    Physically Unclonable Functions (PUFs) are lightweight cryptographic primitives for generating unique signatures from complex manufacturing variations. In this work, we present a current-based PUF designed using a generalized lithographic simulation framework for improving inter-die and inter-wafer uniqueness. The sensitivity of the circuit to manufacturing variations is enhanced by placing the gate structures at pitches closer to forbidden zone, where the sensitivity of Critical Dimension (CD) to the pitch variations is very high. Simulation results show that the litho-aware current based PUF has improved inter- and intra-distance over the conventional current-based PUF. The litho-aware PUF consumes about 0.034 pico joules of energy per response bit, which is substantially better than delay-based PUF implementations.
  • Keywords
    cryptography; integrated circuit design; lithography; low-power electronics; complex manufacturing variations; critical dimension; forbidden zone; gate structures; generalized lithographic simulation framework; inter-die uniqueness; inter-wafer uniqueness; lightweight cryptographic primitives; litho-aware current based PUF; low power design; physically unclonable function; pitch variations; Integrated circuit modeling; Integrated circuit reliability; Logic gates; Semiconductor device modeling; Sensitivity; Transistors; Physically unclonable functions; forbidden pitches; hardware security; sub-wavelength lithography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design (ISLPED), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-1234-6
  • Type

    conf

  • DOI
    10.1109/ISLPED.2013.6629331
  • Filename
    6629331