DocumentCode :
3498496
Title :
A study of memory effect of partial discharges
Author :
Madhavi, Y.L. ; Narayanachar, M.N.
Author_Institution :
Dept. of High Voltage Eng., Indian Inst. of Sci., Bangalore, India
Volume :
5
fYear :
1999
fDate :
1999
Firstpage :
305
Abstract :
From the computed conditional pulse amplitude and phase distributions it is shown that, as the gap spacing is reduced, the charging of a dielectric surface affects the corona pulse-time distribution which becomes significant at lower gap spacings. Most probable values are found to be the best statistical indicators for interpreting the results
Keywords :
insulation testing; conditional pulse amplitude; corona pulse-time distribution; dielectric surface charging; gap spacing; gap spacings; memory effect; partial discharges; phase distributions;
fLanguage :
English
Publisher :
iet
Conference_Titel :
High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
Conference_Location :
London
ISSN :
0537-9989
Print_ISBN :
0-85296-719-5
Type :
conf
DOI :
10.1049/cp:19990946
Filename :
818298
Link To Document :
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