• DocumentCode
    3498496
  • Title

    A study of memory effect of partial discharges

  • Author

    Madhavi, Y.L. ; Narayanachar, M.N.

  • Author_Institution
    Dept. of High Voltage Eng., Indian Inst. of Sci., Bangalore, India
  • Volume
    5
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    305
  • Abstract
    From the computed conditional pulse amplitude and phase distributions it is shown that, as the gap spacing is reduced, the charging of a dielectric surface affects the corona pulse-time distribution which becomes significant at lower gap spacings. Most probable values are found to be the best statistical indicators for interpreting the results
  • Keywords
    insulation testing; conditional pulse amplitude; corona pulse-time distribution; dielectric surface charging; gap spacing; gap spacings; memory effect; partial discharges; phase distributions;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
  • Conference_Location
    London
  • ISSN
    0537-9989
  • Print_ISBN
    0-85296-719-5
  • Type

    conf

  • DOI
    10.1049/cp:19990946
  • Filename
    818298
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3498496