PARCRIPT: a very fast combinational fault simulator

Author

Jou, Jer Min ; Chen, Shung-Chih

Author_Institution

Dept. of Electr. Eng., National Cheng-Kung Univ., Tainan, Taiwan

fYear

1993

fDate

1993

Firstpage

54

Lastpage

57

Abstract

A new combinational fault simulator, PARCRIPT, which combines the merits of the concept of the parallel fault simulation and the efficiency of the critical path tracing (CRIPT), is presented. The key idea of PARCRIPT is to simultaneously propagate the criticalities of the potential stems to determine whether a potential stem is critical. Critical path tracing then traces from the critical potential stem to find the detected faults inside the fanout-free region. Experimental results show that PARCRIPT run 2-5 times faster than PROOFS for 10 combinational benchmark circuits.

Keywords

VLSI; circuit analysis computing; combinatorial circuits; critical path analysis; logic CAD; logic testing; PARCRIPT; VLSI; critical path tracing; fanout-free region; parallel fault simulation; very fast combinational fault simulator; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Electrical fault detection; Fault detection; Fault diagnosis; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on

Conference_Location

Taipei, Taiwan

ISSN

1524-766X

Print_ISBN

0-7803-0978-2

Type

conf

DOI

10.1109/VTSA.1993.263626

Filename

263626