• DocumentCode
    3498693
  • Title

    Test processor ASIC design

  • Author

    Ali, Md Liakot ; Darus, Zahari Mohamed ; Ali, Mohd Alauddin Mohd ; Ahmed, Iftekhar

  • Author_Institution
    Dept. of Electr. Electron. & Syst. Eng., Univ. Kebangsaan, Malaysia
  • fYear
    1996
  • fDate
    26-28 Nov 1996
  • Firstpage
    261
  • Lastpage
    265
  • Abstract
    In this paper, a design of a test processor ASIC employing a probabilistic approach is presented. The test processor chip is computer programmable. It consists of linear feedback shift register (LFSR) which can select one of 16 polynomials and set user programmable need for every test set, signature analyzer and 3 built-in RAMs and other control circuitry. It is capable of generating random numbers and applying them to the circuit under test (CUT) and then retrieve the responses from the CUT. It can generate a signature by compressing the response data and detect circuit faults by comparing this signature with that of a good CUT. This ASIC can be used to design a low cost IC tester of reliable performance
  • Keywords
    VLSI; application specific integrated circuits; automatic test equipment; automatic testing; built-in self test; digital signal processing chips; integrated circuit testing; logic testing; shift registers; LFSR; built-in RAMs; circuit fault detection; computer programmable tester; control circuitry; linear feedback shift register; low cost IC tester; polynomials selection; probabilistic approach; pseudorandom testing technique; random numbers generation; response data compression; signature analyzer; test processor ASIC design; test processor chip; test set; Application specific integrated circuits; Circuit testing; Electrical fault detection; Fault detection; Feedback circuits; Linear feedback control systems; Linear feedback shift registers; Polynomials; Process design; Random number generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 1996. ICSE '96. Proceedings., 1996 IEEE International Conference on
  • Conference_Location
    Penang
  • Print_ISBN
    0-7803-3388-8
  • Type

    conf

  • DOI
    10.1109/SMELEC.1996.616494
  • Filename
    616494