Title :
Ellipsometric analysis for growth of Ag2S film and effect of oil film on corrosion resistance of Ag contact surface
Author_Institution :
Electron. Lab., Hyogo Univ. of Teacher Educ., Hyogo, Japan
Abstract :
By applying ellipsometric analysis, the relationship between the growth of Ag/sub 2/S film and exposure to a H/sub 2/S gas environment was clarified with respect to the contact resistance and formation of the film. Parameters for corrosion kinetics were deduced that are concerned with the growth laws of Ag/sub 2/S film. Furthermore, the effects of oil films on the corrosion resistance of an Ag surface were examined. Stearic acid was used as the oil specimen. The influence of the thickness of the oil film on the contact resistance property was studied for a clean Ag surface and for the surface exposed to an H/sub 2/S gas environment. The optimum thickness for the oil film to sustain low contact resistance was found.<>
Keywords :
contact resistance; corrosion protective coatings; corrosion testing; electrical contacts; ellipsometry; hydrogen compounds; reliability; silver; silver compounds; Ag contact surface; Ag/sub 2/S film growth; H/sub 2/S gas environment; contact resistance; corrosion kinetics; corrosion resistance; ellipsometric analysis; growth laws; oil film; optimum oil film thickness; stearic acid oil film; Corrosion; Optical films; Optical polarization; Optical surface waves; Petroleum; Pollution measurement; Surface cleaning; Surface contamination; Surface morphology; Surface resistance;
Conference_Titel :
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/HOLM.1988.16130
