Title :
Electrothermal Phenomena in Bipolar Transistors and ICs: Analysis, Modeling, and Simulation
Author :
Rinaldi, N. ; Alessandro, V. D´ ; De Paola, F.M.
Author_Institution :
Dept. of Electron. & Telecommun. Eng., Naples Univ.
Abstract :
This paper addresses some relevant issues and recent developments concerning the analysis and simulation of electrothermal effects in bipolar devices and circuits
Keywords :
bipolar integrated circuits; bipolar transistors; integrated circuit modelling; integrated circuit reliability; integrated circuits; semiconductor device models; semiconductor device reliability; thermal management (packaging); BJT; IC; bipolar integrated circuits; bipolar junction transistor; electrothermal phenomena simulation; impact ionization; thermal instability; Analog circuits; Analytical models; Bipolar transistors; Circuit simulation; Electrothermal effects; Impact ionization; Temperature; Thermal management; Thermal resistance; Voltage; Bipolar Junction Transistor (BJT); analog circuits; bipolar modeling and simulation; device physics; electrothermal simulation; impact ionization; thermal instability;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2006
Conference_Location :
Maastricht
Print_ISBN :
1-4244-0458-4
Electronic_ISBN :
1088-9299
DOI :
10.1109/BIPOL.2006.311153
