• DocumentCode
    3498916
  • Title

    Toward a practical methodology for the statistical design of complex integrated circuit products

  • Author

    Duvall, Steven G.

  • Author_Institution
    Intel Corp., Santa Clara, CA, USA
  • fYear
    1993
  • fDate
    1993
  • Firstpage
    112
  • Lastpage
    116
  • Abstract
    The author discusses statistical, as opposed to worst case, approaches to the design of complex integrated circuit products. Recent approaches and why they have failed to be widely adopted are reviewed. The author concludes with a discussion of a practical approach to complex integrated circuit design combining worst case and statistical methods.
  • Keywords
    design engineering; integrated circuit technology; semiconductor process modelling; complex integrated circuit products; design methodology; modelling; process effects; statistical design; uncertainty; Design methodology; Fluctuations; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit synthesis; MOS devices; Manufacturing processes; Process design; Robustness; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on
  • Conference_Location
    Taipei, Taiwan
  • ISSN
    1524-766X
  • Print_ISBN
    0-7803-0978-2
  • Type

    conf

  • DOI
    10.1109/VTSA.1993.263639
  • Filename
    263639
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3498916