Title :
Fully coupled dynamic self heating model for power SOI Lateral Insulated Gate Bipolar Transistors
Author :
Gamage, S. ; Pathirana, V. ; Udrea, F.
Author_Institution :
Electr. Eng. Div., Cambridge Univ.
Abstract :
Several vertical IGBT electro-thermal models are currently available on circuit simulators. However, no reliable electro-thermal models have been proposed for the lateral insulated gate bipolar transistor (LGBT). In this paper, for the first time we present a fully coupled electrothermal model for a LIGBT structure based on a novel concept recently reported in (Napoli, et. al., 2005). The model relies on a systematic study of both isothermal and self heating behavior of the device. It is valid in both steady state and switching conditions. The model is further implemented in the Spice circuit simulator and validated against extensive numerical simulations and experimental data
Keywords :
SPICE; insulated gate bipolar transistors; power semiconductor switches; silicon-on-insulator; IGBT; Spice circuit simulator; dynamic self heating model; electro thermal models; electrothermal effects; insulated gate bipolar transistors; power SOI lateral; power semiconductor switches; Circuit simulation; Coupling circuits; Electrothermal effects; Heating; Insulated gate bipolar transistors; Isothermal processes; Numerical simulation; Power system modeling; Power system reliability; Steady-state; Electrothermal effects; Insulated gate bipolar transistors; Modeling; Power semiconductor switches;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2006
Conference_Location :
Maastricht
Print_ISBN :
1-4244-0458-4
Electronic_ISBN :
1088-9299
DOI :
10.1109/BIPOL.2006.311177