A low-overhead method of embedded software profiling

With the continuous development of embedded technology, embedded applications are becoming increasingly popular in daily lives, and respectively embedded software is in great demand. As a result, how to profile embedded software to guarantee its quality becomes a focus of attention. This paper focuses on this issue. It analyzes current methods of embedded software profiling and their defects, and then proposes a low-overhead and more accurate method. It also performs some strict experiments to prove that it is effective and much better than current methods.