DocumentCode
3499596
Title
Simultaneous Extraction of Collector and Substrate Series Resistance by Simple DC Measurement
Author
Chen, Tianbing ; Krakowski, Tracey L. ; Strachan, Andy ; Liu, Yun ; Sadovnikov, Alexei ; Babcock, Jeff
Author_Institution
Nat. Semicond. Corp., Santa Clara, CA
fYear
2006
fDate
8-10 Oct. 2006
Firstpage
1
Lastpage
4
Abstract
A new forced emitter current method is proposed for the simultaneous measurement of collector and substrate series resistance in bipolar transistors. Compared with conventional series resistance extraction method, this new method does not need any prior knowledge of certain device parameters, or any pre-selected bias condition. It can be used for any bulk bipolar technology
Keywords
bipolar transistors; electric resistance measurement; semiconductor device measurement; DC measurement; bipolar technology; bipolar transistors; collector series resistance measurement; forced emitter current method; series resistance extraction method; substrate series resistance measurement; Bipolar transistors; Contact resistance; Current measurement; Electrical resistance measurement; Equivalent circuits; Force measurement; P-n junctions; Substrates; Virtual colonoscopy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology Meeting, 2006
Conference_Location
Maastricht
ISSN
1088-9299
Print_ISBN
1-4244-0458-4
Electronic_ISBN
1088-9299
Type
conf
DOI
10.1109/BIPOL.2006.311121
Filename
4100256
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