DocumentCode :
3499601
Title :
Ambipolar semiconductor receiver application in THz range
Author :
Kamenev, Yu.E. ; Korzh, V.G. ; Sizov, F.F. ; Momot, N.I.
Author_Institution :
Inst. of Radiophys. & Electron., NASU, Kharkov, Ukraine
fYear :
2010
fDate :
21-26 June 2010
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, the theoretical and experimental research in the millimeter range have allowed to offer THz range semiconductor receiver, which uses the phenomenon of ambipolar diffusion in a thin layer of a semiconductor. For the optimal performance of the proposed receiver it is required to use a special device for signal displacement and pick up from the sensing element, as well as cryogenic device for setup and holding required temperature. THz rage laser with a wavelength λ= 190 and 337 microns is used as radiation source.
Keywords :
II-VI semiconductors; cadmium compounds; diffusion; laser beam effects; mercury compounds; millimetre wave receivers; Hg1-xCdxTe; ambipolar diffusion; cryogenic device; laser radiation source; semiconductor receiver; sensing element; signal displacement; terahertz range;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2010 International Kharkov Symposium on
Conference_Location :
Kharkiv
Print_ISBN :
978-1-4244-7900-9
Type :
conf
DOI :
10.1109/MSMW.2010.5546030
Filename :
5546030
Link To Document :
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