• DocumentCode
    3499649
  • Title

    Detection of small defects by THz-waves for non-destructive testing in dielectric layered structures

  • Author

    Scherbatko, I.S. ; Kuleshov, Ye M.

  • Author_Institution
    Dept. of Quasi-Opt., Inst. of Radiophys. & Electron., Kharkov, Ukraine
  • fYear
    2010
  • fDate
    21-26 June 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this study, the small defects detection in dielectric layered structures by THz waves for nondestructive testing. Finite element method were used for modelling of the structures.
  • Keywords
    dielectric materials; finite element analysis; nondestructive testing; terahertz waves; THz-waves; defect detection; dielectric layered structures; finite element method; nondestructive testing; Noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2010 International Kharkov Symposium on
  • Conference_Location
    Kharkiv
  • Print_ISBN
    978-1-4244-7900-9
  • Type

    conf

  • DOI
    10.1109/MSMW.2010.5546032
  • Filename
    5546032
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3499649