DocumentCode :
3500141
Title :
Key factors in designing a manufacturing line to maximize tool utilization and minimize turnaround time
Author :
Martin, Donald P.
Author_Institution :
IBM Technol. Products, Essex Junction, VT, USA
fYear :
1993
fDate :
1993
Firstpage :
48
Lastpage :
53
Abstract :
Today´s semiconductor manufacturing facilities require very expensive tools, with the total investment necessary to equip a production line approaching a half-billion dollars. Therefore, it is imperative to understand those factors that help to determine the number of tools to be purchased, their characteristics, and how they should be arranged to attain the most effective utilization of these assets. This paper shows that the imposition of a turnaround-time (TAT) requirement on a tool set/manufacturing line introduces additional constraints on tool operating characteristics. Tool availability, the time a tool is off line, and the number of tools per process now become key factors that must be used to determine the effective capacity and achievable turnaround time of a tool set/manufacturing line. The results of this work show how tool design and installation characteristics can significantly improve line capacity and reduce TAT. Some fundamental elements of designing a manufacturing line are also discussed, such as when tools should be arranged in a ´farmed´ mode (in close proximity because of process similarity and their independence from process flow) or a ´linear´ mode, (with dissimilar tools/processes arranged in close proximity because of process-flow sequence).
Keywords :
production control; queueing theory; semiconductor device manufacture; effective capacity; farmed mode; line capacity; linear mode; manufacturing line; semiconductor manufacturing facilities; tool operating characteristics; tool utilization; turnaround time; Costs; Investments; Manufacturing processes; Production facilities; Productivity; Queueing analysis; Semiconductor device manufacture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Science Symposium, 1993. ISMSS 1993., IEEE/SEMI International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-1212-0
Type :
conf
DOI :
10.1109/ISMSS.1993.263701
Filename :
263701
Link To Document :
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