• DocumentCode
    3500507
  • Title

    Modeling of a floating-gate EEPROM cell using a charge sheet approach

  • Author

    Bouchakour, R. ; Harabech, N. ; Canet, P. ; Mirabel, J.M. ; Boivin, Ph ; Pizzuto, O.

  • Author_Institution
    Lab. Materiaux et Microelectronique de Provence, Inst. Charles Fabry, Marseille, France
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1264
  • Abstract
    A model for static and transient simulations of an electrically erasable programmable read only memory cell has been developed. This physical compact model is based on charge sheet approach which is able to describe the complete electrical behavior of the cell. In this model the charge neutrality, including the charge trapped on the floating gate, is applied to determine the surface potential. From the surface potential, related to the terminal voltages, the drain current and the different charges present in the cell structure can be calculated. This model has been successfully implemented in common circuit simulators and used for the study of the write/erase operations in an electrically erasable programmable read only memory cell
  • Keywords
    EPROM; capacitance; electric charge; equivalent circuits; integrated circuit modelling; integrated memory circuits; semiconductor device models; surface potential; transient analysis; tunnelling; EEPROM cell model; charge neutrality; charge sheet approach; charge trapped; drain current; electrical behavior; electrically erasable PROM; floating-gate EEPROM cell; memory cell; physical compact model; simulators; static simulations; surface potential; terminal voltages; transient simulations; write/erase operations; Capacitance; Circuit simulation; EPROM; Electrons; Gaussian processes; Nonvolatile memory; Substrates; Threshold voltage; Tunneling; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
  • Conference_Location
    Lansing, MI
  • Print_ISBN
    0-7803-6475-9
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2000.951445
  • Filename
    951445