Title :
Modeling of a floating-gate EEPROM cell using a charge sheet approach
Author :
Bouchakour, R. ; Harabech, N. ; Canet, P. ; Mirabel, J.M. ; Boivin, Ph ; Pizzuto, O.
Author_Institution :
Lab. Materiaux et Microelectronique de Provence, Inst. Charles Fabry, Marseille, France
Abstract :
A model for static and transient simulations of an electrically erasable programmable read only memory cell has been developed. This physical compact model is based on charge sheet approach which is able to describe the complete electrical behavior of the cell. In this model the charge neutrality, including the charge trapped on the floating gate, is applied to determine the surface potential. From the surface potential, related to the terminal voltages, the drain current and the different charges present in the cell structure can be calculated. This model has been successfully implemented in common circuit simulators and used for the study of the write/erase operations in an electrically erasable programmable read only memory cell
Keywords :
EPROM; capacitance; electric charge; equivalent circuits; integrated circuit modelling; integrated memory circuits; semiconductor device models; surface potential; transient analysis; tunnelling; EEPROM cell model; charge neutrality; charge sheet approach; charge trapped; drain current; electrical behavior; electrically erasable PROM; floating-gate EEPROM cell; memory cell; physical compact model; simulators; static simulations; surface potential; terminal voltages; transient simulations; write/erase operations; Capacitance; Circuit simulation; EPROM; Electrons; Gaussian processes; Nonvolatile memory; Substrates; Threshold voltage; Tunneling; Voltage control;
Conference_Titel :
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Conference_Location :
Lansing, MI
Print_ISBN :
0-7803-6475-9
DOI :
10.1109/MWSCAS.2000.951445