Title :
Cad-Oriented Models Of Packaged Low-Noise HEMTs From Measured Noise And Scattering Parameters
Author :
Caddemi, Alina ; Gambino, G. ; Sannino, Mario
Keywords :
Circuit noise; Equivalent circuits; HEMTs; MODFETs; National electric code; Noise measurement; Packaging; Performance analysis; Scattering parameters; Semiconductor device measurement;
Conference_Titel :
Microwave Conference/Brazil, 1993., SBMO International
Print_ISBN :
0-7803-1288-0
DOI :
10.1109/SBMO.1993.587221