Title :
Testability Analysis of Digital Design Verification
Author :
Hahanov, V. ; Kaminska, M. ; Fomina, E.
Author_Institution :
Kharkov Nat. Univ. of Radioelectronics
Abstract :
A new method of testability analysis of digital design verification is presented. The method describes substantial graph-schemes that give possibility to simplify the verification task and to generate test synthesis and and/or to improve faults covering for the given inputs. The topological analysis of an oriented graph and further modification by separation of operating modes (test and functional) of a digital device is the base of the proposed technique. The main goal of the presented algorithm is improvement of testability and simplification of the verification task
Keywords :
design for testability; digital circuits; digital design verification; substantial graph-schemes; testability analysis; Algorithm design and analysis; Application specific integrated circuits; Costs; Design engineering; Hardware; Production; Signal design; Software testing; System testing; Zirconium;
Conference_Titel :
Baltic Electronics Conference, 2006 International
Conference_Location :
Tallinn
Print_ISBN :
1-4244-0414-2
Electronic_ISBN :
1736-3705
DOI :
10.1109/BEC.2006.311090