Title :
LFSR Polynomial and Seed Selection Using Genetic Algorithm
Author :
Aleksejev, E. ; Jutman, A. ; Ubar, R.
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol.
Abstract :
In this paper the authors present a framework aimed at optimization of important properties of pseudo-random test pattern generators used in embedded testing of modern complex digital devices like systems-on-chip. The method we propose is based on an evolutionary technique often referred as the genetic algorithm. Experimental results show the feasibility of the proposed method
Keywords :
automatic test pattern generation; genetic algorithms; shift registers; system-on-chip; genetic algorithm; linear feedback shift registers; pseudorandom test pattern generators; seed selection; system-on-chip; Built-in self-test; Circuit testing; Clocks; Embedded computing; Feedback loop; Genetic algorithms; Genetic engineering; Polynomials; System testing; Test pattern generators;
Conference_Titel :
Baltic Electronics Conference, 2006 International
Conference_Location :
Tallinn
Print_ISBN :
1-4244-0414-2
Electronic_ISBN :
1736-3705
DOI :
10.1109/BEC.2006.311092
