Title :
Tutorial II: Variability and Its Impact on Design
Author :
Bowman, Keith ; Orshansky, Michael ; Sapatnekar, Sachin S.
Author_Institution :
Intel Corporation
Abstract :
Summary form only for tutorial. As digital designs scale down into the sub-100nm regime, the effects of variations are seen to dramatically affect the behavior of the circuit. These may arise from.
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
DOI :
10.1109/ISQED.2006.141
