DocumentCode :
3500633
Title :
Post silicon skew tuning: Survey and analysis
Author :
Kao, Mac Y C ; Tsai, Kun-Ting ; Chou, Hsuan-Ming ; Chang, Shih-Chieh
fYear :
2012
fDate :
Jan. 30 2012-Feb. 2 2012
Firstpage :
646
Lastpage :
651
Abstract :
Clock skew minimization is an important design consideration. However, with the advance of the technology and the smaller device scaling, Process, Voltage, and Temperature (PVT) variations make the clock skew minimization face great challenges. To mitigate the impact of PVT variations, many previous works proposed the Post Silicon Tuning (PST) architecture to dynamically balance the skew of a clock tree. In the PST architecture, there are two main components: Adjustable Delay Buffer (ADB) and Phase Detector (PD). In this paper, we make a survey about existing techniques to the PST architecture and introduce several important design concerns such as the ADB selection, system controlling, and design testing to the PST architecture.
Keywords :
buffer circuits; circuit tuning; clocks; elemental semiconductors; flip-flops; logic design; phase detectors; silicon; trees (mathematics); ADB selection; PD; PST architecture; PVT variations; Si; adjustable-delay buffer; clock skew minimization; clock tree; design testing; device scaling; phase detector; post-silicon skew tuning; post-silicon tuning architecture; process-voltage-temperature variation; system controlling; Clocks; Conferences; Delay; Fault tolerance; Fault tolerant systems; Synchronization; Testing; Post-Silicon Tuning; Scheduling; Timing Optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific
Conference_Location :
Sydney, NSW
ISSN :
2153-6961
Print_ISBN :
978-1-4673-0770-3
Type :
conf
DOI :
10.1109/ASPDAC.2012.6165036
Filename :
6165036
Link To Document :
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