• DocumentCode
    3500633
  • Title

    Post silicon skew tuning: Survey and analysis

  • Author

    Kao, Mac Y C ; Tsai, Kun-Ting ; Chou, Hsuan-Ming ; Chang, Shih-Chieh

  • fYear
    2012
  • fDate
    Jan. 30 2012-Feb. 2 2012
  • Firstpage
    646
  • Lastpage
    651
  • Abstract
    Clock skew minimization is an important design consideration. However, with the advance of the technology and the smaller device scaling, Process, Voltage, and Temperature (PVT) variations make the clock skew minimization face great challenges. To mitigate the impact of PVT variations, many previous works proposed the Post Silicon Tuning (PST) architecture to dynamically balance the skew of a clock tree. In the PST architecture, there are two main components: Adjustable Delay Buffer (ADB) and Phase Detector (PD). In this paper, we make a survey about existing techniques to the PST architecture and introduce several important design concerns such as the ADB selection, system controlling, and design testing to the PST architecture.
  • Keywords
    buffer circuits; circuit tuning; clocks; elemental semiconductors; flip-flops; logic design; phase detectors; silicon; trees (mathematics); ADB selection; PD; PST architecture; PVT variations; Si; adjustable-delay buffer; clock skew minimization; clock tree; design testing; device scaling; phase detector; post-silicon skew tuning; post-silicon tuning architecture; process-voltage-temperature variation; system controlling; Clocks; Conferences; Delay; Fault tolerance; Fault tolerant systems; Synchronization; Testing; Post-Silicon Tuning; Scheduling; Timing Optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific
  • Conference_Location
    Sydney, NSW
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-0770-3
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2012.6165036
  • Filename
    6165036