Title :
Advanced CMOS technologies using III-V/Ge channels
Author :
Takagi, Shinichi ; Takenaka, Mitsuru
Author_Institution :
Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
Abstract :
CMOS utilizing high mobility III-V/Ge channels on Si substrates is expected to be one of key devices for high performance and low power advanced LSIs in the future. In addition, the heterogeneous integration of these materials with Si can provide a variety of More-than-Moore and Beyond CMOS applications, where various III-V/Ge functional devices can be co-integrated. In this presentation, we review the current status of III-V/Ge CMOS, the critical issues and possible solutions to break through the difficulties.
Keywords :
CMOS integrated circuits; III-V semiconductors; elemental semiconductors; germanium; silicon; CMOS technology; Ge; III-V/Ge channels; Si; beyond CMOS application; heterogeneous integration; more-than-Moore application; CMOS integrated circuits; Logic gates; MOSFET circuits; Metals; Silicon; Substrates;
Conference_Titel :
VLSI Technology, Systems and Applications (VLSI-TSA), 2011 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-8493-5
DOI :
10.1109/VTSA.2011.5872214