DocumentCode
3500673
Title
Distributed Genetic Algorithm of Test Generation For Digital Circuits
Author
Skobtsov, Y.A. ; El-Khatib, A.I. ; Ivanov, D.E.
Author_Institution
Donetsk Nat. Tech. Univ.
fYear
2006
fDate
2-4 Oct. 2006
Firstpage
1
Lastpage
4
Abstract
The distributed genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation
Keywords
automatic testing; digital circuits; genetic algorithms; digital circuits; distributed calculations; distributed genetic algorithm; fault simulation; test generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Electronics packaging; Genetic algorithms; Logic testing; Parallel processing; Sequential circuits; digital circuits; distributed calculations; fault simulation; genenic algorithms; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Baltic Electronics Conference, 2006 International
Conference_Location
Tallinn
ISSN
1736-3705
Print_ISBN
1-4244-0414-2
Electronic_ISBN
1736-3705
Type
conf
DOI
10.1109/BEC.2006.311096
Filename
4100317
Link To Document