Title :
Distributed Genetic Algorithm of Test Generation For Digital Circuits
Author :
Skobtsov, Y.A. ; El-Khatib, A.I. ; Ivanov, D.E.
Author_Institution :
Donetsk Nat. Tech. Univ.
Abstract :
The distributed genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation
Keywords :
automatic testing; digital circuits; genetic algorithms; digital circuits; distributed calculations; distributed genetic algorithm; fault simulation; test generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Electronics packaging; Genetic algorithms; Logic testing; Parallel processing; Sequential circuits; digital circuits; distributed calculations; fault simulation; genenic algorithms; test generation;
Conference_Titel :
Baltic Electronics Conference, 2006 International
Conference_Location :
Tallinn
Print_ISBN :
1-4244-0414-2
Electronic_ISBN :
1736-3705
DOI :
10.1109/BEC.2006.311096
