• DocumentCode
    3500674
  • Title

    Deep sub-100 nm Design Challenges

  • Author

    Furuyama, T.

  • Author_Institution
    Toshiba
  • fYear
    2006
  • fDate
    27-29 March 2006
  • Firstpage
    13
  • Lastpage
    14
  • Abstract
    Moore´s law and the scaling theory have been the guiding principle for the semiconductor industry to accomplish its rapid progress and persistent growth. Semiconductor chips had been continuously benefited from the device scaling by simultaneously achieving higher density, higher performance and lower power consumption until they reached the 100 nm technology node. However, once the silicon technology exceeded this point, i.e. in sub-100 nm nodes, some important device parameters have started to diverge from the scaling theory, such as threshold voltages and leakage currents.
  • Keywords
    CMOS technology; Circuits; Design engineering; Energy consumption; Engineering management; Large scale integration; Memory management; Project management; Random access memory; Research and development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
  • Print_ISBN
    0-7695-2523-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2006.44
  • Filename
    1613106