DocumentCode
3500674
Title
Deep sub-100 nm Design Challenges
Author
Furuyama, T.
Author_Institution
Toshiba
fYear
2006
fDate
27-29 March 2006
Firstpage
13
Lastpage
14
Abstract
Moore´s law and the scaling theory have been the guiding principle for the semiconductor industry to accomplish its rapid progress and persistent growth. Semiconductor chips had been continuously benefited from the device scaling by simultaneously achieving higher density, higher performance and lower power consumption until they reached the 100 nm technology node. However, once the silicon technology exceeded this point, i.e. in sub-100 nm nodes, some important device parameters have started to diverge from the scaling theory, such as threshold voltages and leakage currents.
Keywords
CMOS technology; Circuits; Design engineering; Energy consumption; Engineering management; Large scale integration; Memory management; Project management; Random access memory; Research and development;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Print_ISBN
0-7695-2523-7
Type
conf
DOI
10.1109/ISQED.2006.44
Filename
1613106
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