DocumentCode :
3500674
Title :
Deep sub-100 nm Design Challenges
Author :
Furuyama, T.
Author_Institution :
Toshiba
fYear :
2006
fDate :
27-29 March 2006
Firstpage :
13
Lastpage :
14
Abstract :
Moore´s law and the scaling theory have been the guiding principle for the semiconductor industry to accomplish its rapid progress and persistent growth. Semiconductor chips had been continuously benefited from the device scaling by simultaneously achieving higher density, higher performance and lower power consumption until they reached the 100 nm technology node. However, once the silicon technology exceeded this point, i.e. in sub-100 nm nodes, some important device parameters have started to diverge from the scaling theory, such as threshold voltages and leakage currents.
Keywords :
CMOS technology; Circuits; Design engineering; Energy consumption; Engineering management; Large scale integration; Memory management; Project management; Random access memory; Research and development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Print_ISBN :
0-7695-2523-7
Type :
conf
DOI :
10.1109/ISQED.2006.44
Filename :
1613106
Link To Document :
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