DocumentCode
3500700
Title
An automated reverse-bias second-breakdown transistor tester
Author
Berning, David
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
1991
fDate
10-15 Mar 1991
Firstpage
339
Lastpage
346
Abstract
An automated instrument for generating curves for the reverse bias, safe operating area of transistors nondestructively is described. A technique for detecting second breakdown that makes automation possible is highlighted. Methods to reduce stress to the device under test are discussed, as are several other innovations that enhance automation. Measurements using the tester are described, and limitations on nondestructive testability are discussed
Keywords
automatic test equipment; automatic testing; semiconductor device testing; transistors; ATE; automatic testing; nondestructive testability; reverse bias; safe operating area; second breakdown; semiconductor device testing; stress; transistor; Automatic testing; Automation; Breakdown voltage; Circuit testing; Clamps; Electric breakdown; Inductors; Instruments; NIST; Nondestructive testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 1991. APEC '91. Conference Proceedings, 1991., Sixth Annual
Conference_Location
Dallas, TX
Print_ISBN
0-7803-0024-6
Type
conf
DOI
10.1109/APEC.1991.146192
Filename
146192
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