Title :
Automated XML-based Test Modelling For Mixed-Signal Circuits
Author_Institution :
Dept. of Electron., ITU, Tallinn
Abstract :
Automated system-level test model approach is introduced, incorporating XML, while making use of interchangeable virtual instruments (IVI) and automatic test markup language (ATML) standards. Integrating basic block models into an automated test framework, targeting specifically mixed-signal ICs, the focus is on abstraction through integrating proven technologies in growing complexity levels. Initial result shows high potential for parallel development of system-level design and test models, thus reducing total production time
Keywords :
XML; automatic test software; integrated circuit testing; mixed analogue-digital integrated circuits; virtual instrumentation; ATML standards; XML; automated test modeling; automatic test markup language; interchangeable virtual instruments; mixed-signal integrated circuits; production time reduction; system-level design; Automatic testing; Circuit testing; Electronic equipment testing; Instruments; Markup languages; Semiconductor device testing; Software testing; System testing; System-level design; XML;
Conference_Titel :
Baltic Electronics Conference, 2006 International
Conference_Location :
Tallinn
Print_ISBN :
1-4244-0414-2
Electronic_ISBN :
1736-3705
DOI :
10.1109/BEC.2006.311098
