DocumentCode
350071
Title
ADAPT: mixed-signal ASIC for impedance adaptation in power line communications using fuzzy logic
Author
Munoz, F. ; Carvajal, R.G. ; Torralba, A. ; Franquelo, L.G. ; Ramos, E. ; Pinilla, J.
Author_Institution
Dipt. de Ingenieria Electron., Seville Univ., Spain
Volume
2
fYear
1999
fDate
1999
Firstpage
509
Abstract
One of the primary sources of problems in communications over electric distribution lines is the impedance variation. This problem often leads to an increase in the BER or makes the communications impossible. As the impedance seen by the communication system varies with location and time of day, an effective coupling of the signal in to the distribution line is needed. In this paper ADAPT, a mixed-signal ASIC that performs impedance adaptation in power line carrier communications using fuzzy logic, is presented. ADAPT also measures the impedance of the power line and the signal to noise ratio. As ADAPT performs a continuous adaptation between the emitter and the power line, maximum power transfer is achieved in each communication, increasing the reliability of the communication system. This experiment has been realized under FUSE special action in collaboration with SAINCO
Keywords
carrier transmission on power lines; electric impedance measurement; fuzzy logic; mixed analogue-digital integrated circuits; power distribution lines; power system measurement; ADAPT; communication system reliability; electric distribution lines; emitter; fuzzy logic; impedance adaptation; impedance variation; maximum power transfer; mixed-signal ASIC; power line communications; power line impedance measurement; power line noise ratio measurement; signal coupling; Application specific integrated circuits; Bit error rate; Collaboration; Fuses; Fuzzy logic; Impedance measurement; Noise measurement; Power measurement; Power system reliability; Signal to noise ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics Society, 1999. IECON '99 Proceedings. The 25th Annual Conference of the IEEE
Conference_Location
San Jose, CA
Print_ISBN
0-7803-5735-3
Type
conf
DOI
10.1109/IECON.1999.816426
Filename
816426
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