• DocumentCode
    3500824
  • Title

    EFSM manipulation to increase high-level ATPG effectiveness

  • Author

    Guglielmo, Giuseppe Di ; Fummi, Franco ; Marconcini, Cristina ; Pravadelli, Graziano

  • Author_Institution
    Dipt. di Informatica, Universita di Verona
  • fYear
    2006
  • fDate
    27-29 March 2006
  • Lastpage
    62
  • Abstract
    The EFSM paradigm can be efficiently adopted to model complex designs without incurring in the state explosion problem typical of the traditional FSM paradigm. However, traversing an EFSM can be more difficult than an FSM because the guards of transitions involve both primary inputs and internal registers. Hard-to-traverse transitions represent a problem when a simulation-based approach is applied to perform functional validation. In fact, they do not allow a complete exploration of the state space. In this paper, EFSM hard-to-traverse transitions are classified, and a set of transformations is proposed to generate an EFSM model which is easy to be traversed. This allows pseudo-deterministic ATPGs to more uniformly analyze the state space of the resulting EFSM
  • Keywords
    automatic test pattern generation; finite state machines; high level synthesis; state-space methods; EFSM manipulation; automatic test pattern generation; extended finite state machine; functional validation; hard-to-traverse transitions; high-level ATPG; internal registers; pseudodeterministic ATPG; state explosion problem; state space exploration; Automata; Automatic test pattern generation; Data mining; Explosions; Fault detection; Hardware design languages; Mathematical model; State-space methods; Test pattern generators; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2523-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2006.58
  • Filename
    1613114