DocumentCode
3500824
Title
EFSM manipulation to increase high-level ATPG effectiveness
Author
Guglielmo, Giuseppe Di ; Fummi, Franco ; Marconcini, Cristina ; Pravadelli, Graziano
Author_Institution
Dipt. di Informatica, Universita di Verona
fYear
2006
fDate
27-29 March 2006
Lastpage
62
Abstract
The EFSM paradigm can be efficiently adopted to model complex designs without incurring in the state explosion problem typical of the traditional FSM paradigm. However, traversing an EFSM can be more difficult than an FSM because the guards of transitions involve both primary inputs and internal registers. Hard-to-traverse transitions represent a problem when a simulation-based approach is applied to perform functional validation. In fact, they do not allow a complete exploration of the state space. In this paper, EFSM hard-to-traverse transitions are classified, and a set of transformations is proposed to generate an EFSM model which is easy to be traversed. This allows pseudo-deterministic ATPGs to more uniformly analyze the state space of the resulting EFSM
Keywords
automatic test pattern generation; finite state machines; high level synthesis; state-space methods; EFSM manipulation; automatic test pattern generation; extended finite state machine; functional validation; hard-to-traverse transitions; high-level ATPG; internal registers; pseudodeterministic ATPG; state explosion problem; state space exploration; Automata; Automatic test pattern generation; Data mining; Explosions; Fault detection; Hardware design languages; Mathematical model; State-space methods; Test pattern generators; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2523-7
Type
conf
DOI
10.1109/ISQED.2006.58
Filename
1613114
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