• DocumentCode
    3500841
  • Title

    A technique for estimating the difficulty of a formal verification problem

  • Author

    Ghosh, Indradeep ; Prasad, Mukul R.

  • Author_Institution
    Adv. CAD Technol., Fujitsu Labs. of America, Sunnyvale, CA
  • fYear
    2006
  • fDate
    27-29 March 2006
  • Lastpage
    70
  • Abstract
    In this paper a technique is proposed to estimate the level of difficulty of formally verifying an RTL circuit. The technique is based on extensive experimental data generated from a wide range of industrial and academic benchmarks. Statistical as well as intuitive inferences have been drawn from the data to obtain an algorithm that can classify the level of difficulty of formally verifying a property on a particular circuit into five broad categories. The difficulty of verifying the whole circuit is a weighted average of the difficulty of verifying its individual properties. The level of coverage generated by the properties gives us a confidence level on the accuracy of the metric
  • Keywords
    formal verification; integrated circuit design; logic design; RTL circuit; formal verification; intuitive inference; statistical inference; Circuits; Formal verification; Inference algorithms; Laboratories; Mathematical model; Registers; Runtime; System-on-a-chip; Transistors; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2523-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2006.17
  • Filename
    1613115