• DocumentCode
    3500865
  • Title

    Fast incremental link insertion in clock networks for skew variability reduction

  • Author

    Rajaram, A. ; Pan, David Z.

  • Author_Institution
    Dept. of ECE, Texas Univ., Austin, TX
  • fYear
    2006
  • fDate
    27-29 March 2006
  • Lastpage
    84
  • Abstract
    With the advent of sub-100nm VLSI technologies, variation effects greatly increase the unwanted skew in clock distribution networks (CDNs), thereby reducing the performance of the chip. Recent works on link based non-tree CDN propose cross-link insertion in a given clock tree to reduce skew variation. However, the current methods suffer from the drawback that they are empirical in nature, requiring the user to experiment with different parameter values. Also, the methods of ignore the interaction between the different links while selecting the links for insertion. The method of (W.D. Lam et al., 2005) attempts to overcome this drawback using a statistical link insertion methodology. However, (W.D. Lam et al., 2005) is very slow even for relatively small circuits. In this paper, we propose a fast link insertion methodology which does not require selecting empirical parameters for link insertion. Our method also incrementally considers the effect of previously inserted links before choosing the next link. SPICE based Monte Carlo simulations show that our approach obtains comparable skew reduction to that of the existing approaches while drastically reducing the time taken to obtain a good link-based non-tree CDN
  • Keywords
    Monte Carlo methods; VLSI; clocks; integrated circuit design; Monte Carlo simulations; SPICE; VLSI technologies; clock distribution networks; clock tree; cross-link insertion; incremental link insertion; skew variability reduction; statistical link insertion; Circuits; Clocks; Delay; Digital signal processing chips; Instruments; Intelligent networks; Power supplies; SPICE; Very large scale integration; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2523-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2006.66
  • Filename
    1613117