• DocumentCode
    3500930
  • Title

    Linear-Time Encodable Rate-Compatible Punctured LDPC Codes with Low Error Floors

  • Author

    Song, Seungmoon ; Hwang, Daesung ; Seo, Sunglock ; Ha, Jeongseok

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Inf. & Commun. Univ. (ICU), Daejeon
  • fYear
    2008
  • fDate
    11-14 May 2008
  • Firstpage
    749
  • Lastpage
    753
  • Abstract
    We consider efficiently encodable rate-compatible (E2RC) punctured low-density parity-check (LDPC) codes and show that punctured LDPC codes of the E2RC structure have high error floors at their base code rates. Efficient type-II hybrid Automatic Repeat reQuest (ARQ) protocols are possible with punctured LDPC codes since punctured LDPC codes can support a wide range of code rates with incremental redundancy transmissions. However, such high error floors may result in excessive number of retransmission requests and end up with poor efficiency of hybrid ARQ protocols. We find that the problem of the E2RC structure stems from dispersive right degree distribution and high maximum right degree which is an indispensable element in the E2RC structure. In this paper, we propose a modification to E2RC structure which eliminates the error-floor problem without compromising any of important advantages of the E2RC structure such as linear-time encodability and good bit-error rate (BER) performance over a wide range of code rates. Our claims will be verified with BER and frame error rate (FER) simulation results.
  • Keywords
    error correction codes; error statistics; linear codes; matrix algebra; parity check codes; bit-error rate; efficiently encodable rate-compatible codes; error correction coding; error-floor problem; frame error rate; linear-time E2RC punctured LDPC codes; low-density parity-check codes; parity-check submatrix; Automatic repeat request; Bit error rate; Computer errors; Decoding; Dispersion; Error analysis; Parity check codes; Protocols; Redundancy; Time-varying channels;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 2008. VTC Spring 2008. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1550-2252
  • Print_ISBN
    978-1-4244-1644-8
  • Electronic_ISBN
    1550-2252
  • Type

    conf

  • DOI
    10.1109/VETECS.2008.164
  • Filename
    4525720