• DocumentCode
    3501144
  • Title

    System-level SRAM yield enhancement

  • Author

    Kurdahi, Fadi J. ; Eltawil, Ahmed M. ; Park, Young-Hwan ; Kanj, Rouwaida N. ; Nassif, Sani R.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Irvine, CA
  • fYear
    2006
  • fDate
    27-29 March 2006
  • Lastpage
    184
  • Abstract
    It is well known that SRAM constitutes a large portion of modern integrated circuits, with 80% or more of the total transistors being dedicated to SRAM in a typical processor or SOC. Thus yield management of these SRAMs plays a crucial role in insuring design success. This paper demonstrates analysis techniques to model and improve the yield of SRAMs at the system level by proper accounting for the coupling between the algorithms targeted for an SOC and the performance, power, and yield of SRAMs used in implementing the algorithms. It is shown that coupling the algorithm and SRAM design phases provides significant advantages over independent optimization
  • Keywords
    SRAM chips; integrated circuit design; integrated circuit yield; logic design; system-on-chip; SRAM yield enhancement; modern integrated circuits; system-on-chip; yield management; Algorithm design and analysis; Coupling circuits; Fluctuations; Geometry; Integrated circuit yield; Manufacturing; Random access memory; Resource description framework; Threshold voltage; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2523-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2006.130
  • Filename
    1613133