DocumentCode
3501144
Title
System-level SRAM yield enhancement
Author
Kurdahi, Fadi J. ; Eltawil, Ahmed M. ; Park, Young-Hwan ; Kanj, Rouwaida N. ; Nassif, Sani R.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., California Univ., Irvine, CA
fYear
2006
fDate
27-29 March 2006
Lastpage
184
Abstract
It is well known that SRAM constitutes a large portion of modern integrated circuits, with 80% or more of the total transistors being dedicated to SRAM in a typical processor or SOC. Thus yield management of these SRAMs plays a crucial role in insuring design success. This paper demonstrates analysis techniques to model and improve the yield of SRAMs at the system level by proper accounting for the coupling between the algorithms targeted for an SOC and the performance, power, and yield of SRAMs used in implementing the algorithms. It is shown that coupling the algorithm and SRAM design phases provides significant advantages over independent optimization
Keywords
SRAM chips; integrated circuit design; integrated circuit yield; logic design; system-on-chip; SRAM yield enhancement; modern integrated circuits; system-on-chip; yield management; Algorithm design and analysis; Coupling circuits; Fluctuations; Geometry; Integrated circuit yield; Manufacturing; Random access memory; Resource description framework; Threshold voltage; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2523-7
Type
conf
DOI
10.1109/ISQED.2006.130
Filename
1613133
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