• DocumentCode
    3501233
  • Title

    A study of novel wafer level LED package based on TSV technology

  • Author

    Dong Chen ; Li Zhang ; Ye Xie ; Tan, K.H. ; Lai, C.M.

  • Author_Institution
    Jiangyin Changdian Adv. Packaging Co., Ltd., Jiangyin, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    52
  • Lastpage
    55
  • Abstract
    LED (light-emitting diode) has many advantages over traditional lighting source such as higher electrical efficiency, faster response, and free of hazardous, which has been attracting more and more interesting from all of world. LED technology has achieved remarkable progress during latest years already. However, high price is still the main block for its wide application. WLP (wafer level package) is an as-know low cost packaging method, which has been demonstrated in IC (integrated circuit) industry already. Wafer level package for LED is expected as a promising solution for reduction of total LED price. Aimed at low package cost, as well as good thermal and electrical performance, a novel wafer level LED package with TSV (through silicon via) interconnection and remote phosphor was studied. And structure of the packaged LED was characterized, and light performance was tested according to standard LED testing method.
  • Keywords
    integrated circuit interconnections; integrated circuit testing; light emitting diodes; phosphors; three-dimensional integrated circuits; wafer level packaging; IC industry; TSV interconnection; TSV technology; WLP; electrical efficiency; integrated circuit industry; light-emitting diode; remote phosphor; standard LED testing method; wafer level LED package; Heat transfer; Light emitting diodes; Packaging; Phosphors; Silicon; Through-silicon vias; Wafer scale integration; LED package; Wafer level; remote phosphor; through silicon via;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474567
  • Filename
    6474567