• DocumentCode
    3501534
  • Title

    The temperature and energy dependence of photoinduced scalar phenomena in chalcogenide thin films

  • Author

    Park, Soo-Ho ; Lee, Hyun-Yong ; Chung, Hong-Bay

  • Author_Institution
    Dept. of Electron. Mater. Eng., Kwangwoon Univ., Seoul, South Korea
  • Volume
    2
  • fYear
    1997
  • fDate
    25 -30 May 1997
  • Firstpage
    624
  • Abstract
    Temperature and energy dependence of thermal bleaching (TB) effect and photorefraction (PR) change, in chalcogenide As40Ge10Se50-xSx (x=0, 25, 35 at.%) thin films have been investigated. When these films were exposed for 15 min using the blue-pass filtered Hg lamp (~4300 Å) after annealing for 30 min around the glass transition temperature Tg (200°C), the stable characteristics of scalar effect were shown in As40Ge10Se15S35 composition, and in that composition the refractive index change Δ n was varied up to 0.02-0.46 according to each thickness conditions and the optical energy gap was shifted to a longer wavelength of approximately 0.67 eV, especially for 1000 Å-thickness. Also, in the case that light source was He-Ne laser, we could observe refractive index change Δ n and red-shift of absorption edge
  • Keywords
    annealing; arsenic compounds; chalcogenide glasses; energy gap; germanium compounds; optical films; optical saturable absorption; photorefractive effect; refractive index; thermo-optical effects; AgGeSeS; As40Ge10Se50-xSx; annealing; chalcogenide thin film; energy dependence; glass transition temperature; optical energy gap; photoinduced scalar effect; photorefraction; refractive index; temperature dependence; thermal bleaching; Annealing; Bleaching; Glass; Lamps; Mercury (metals); Optical films; Photorefractive effect; Refractive index; Temperature dependence; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    0-7803-2651-2
  • Type

    conf

  • DOI
    10.1109/ICPADM.1997.616512
  • Filename
    616512