• DocumentCode
    3501665
  • Title

    EUV lithography introduction at Chipmakers

  • Author

    Wagner, Christian ; Bacelar, Jose ; Harned, Noreen ; Loopstra, Erik ; Hendriks, Stef ; De Jong, Ivo ; Kuerz, Peter ; Levasier, Leon ; van de Kerkhof, M. ; Lowisch, Martin ; Meiling, Hans ; Ockwell, David ; Peeters, Rudy ; Van Setten, Eelco ; Stoeldraijer,

  • Author_Institution
    ASML Netherlands B.V., Veldhoven, Netherlands
  • fYear
    2011
  • fDate
    25-27 April 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    With the 1st NXE:3100, 0.25NA and 0.8σ conventional illumination, being operational at a Semiconductor Manufacturer, we enter the next phase in EUVL implementation. Since 2006 process and early device verification has been done using the two Alpha Demo Tools (ADT´s) located at Leuven, Belgium at IMEC and Albany, New York, USA. Now process integration has started at actual Chipmakers sites. This is a major step for the development and implementation of EUVL. The focus is now on the integration of EUVL exposure tools, along with the rest of lithographic infrastructure such as mask, resist, and computational litho tools, into a manufacturing flow, preparing high volume EUVL manufacturing expected to start in late 2012. Fore high volume manufacturing with EUV, we will update on the design status of the NXE:3300B being introduced in 2012 with a productivity target of 125wph. Featuring a 0.33NA lens and off-axis illumination at full transmission, a half pitch resolution from 22nm to 16nm can be supported.
  • Keywords
    semiconductor device manufacture; semiconductor industry; ultraviolet lithography; 0.33NA lens; Alpha Demo Tools; EUV lithography; NXE:3300B; chipmakers; off-axis illumination; semiconductor manufacturer; size 22 nm to 16 nm; Imaging; Layout; Lighting; Manufacturing; Productivity; Resists; Ultraviolet sources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems and Applications (VLSI-TSA), 2011 International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1524-766X
  • Print_ISBN
    978-1-4244-8493-5
  • Type

    conf

  • DOI
    10.1109/VTSA.2011.5872264
  • Filename
    5872264