• DocumentCode
    3501764
  • Title

    Negative differential conductivity of semiconductor diode with resonance-tunnel border

  • Author

    Prokhorov, E.D. ; Botsula, O.V.

  • Author_Institution
    V. N. Karazin Kharkov Nat. Univ., Kharkov, Ukraine
  • fYear
    2010
  • fDate
    21-26 June 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A number of semiconductor devices possess negative differential conductivity(NDC). In basis their works are tunneling, resonance tunneling, electrons capture on recombination centers or transfer of electrons in the overhead on energy of valley of conductivity zone and other. The authors propose here a novel diode, in which the NDC arise between ohmic contacts due to tunneling or resonance tunneling of electrons through the lateral scopes of diode. The current voltage characteristic of the diodes are determined.
  • Keywords
    electron-hole recombination; ohmic contacts; semiconductor diodes; current voltage characteristics; electrons capture; negative differential conductivity; ohmic contacts; recombination centers; resonance tunnel border; resonance tunneling; semiconductor devices; semiconductor diode; Anodes; Cathodes; Conductivity; Doping; Junctions; Semiconductor diodes; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2010 International Kharkov Symposium on
  • Conference_Location
    Kharkiv
  • Print_ISBN
    978-1-4244-7900-9
  • Type

    conf

  • DOI
    10.1109/MSMW.2010.5546144
  • Filename
    5546144