DocumentCode :
3501764
Title :
Negative differential conductivity of semiconductor diode with resonance-tunnel border
Author :
Prokhorov, E.D. ; Botsula, O.V.
Author_Institution :
V. N. Karazin Kharkov Nat. Univ., Kharkov, Ukraine
fYear :
2010
fDate :
21-26 June 2010
Firstpage :
1
Lastpage :
3
Abstract :
A number of semiconductor devices possess negative differential conductivity(NDC). In basis their works are tunneling, resonance tunneling, electrons capture on recombination centers or transfer of electrons in the overhead on energy of valley of conductivity zone and other. The authors propose here a novel diode, in which the NDC arise between ohmic contacts due to tunneling or resonance tunneling of electrons through the lateral scopes of diode. The current voltage characteristic of the diodes are determined.
Keywords :
electron-hole recombination; ohmic contacts; semiconductor diodes; current voltage characteristics; electrons capture; negative differential conductivity; ohmic contacts; recombination centers; resonance tunnel border; resonance tunneling; semiconductor devices; semiconductor diode; Anodes; Cathodes; Conductivity; Doping; Junctions; Semiconductor diodes; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2010 International Kharkov Symposium on
Conference_Location :
Kharkiv
Print_ISBN :
978-1-4244-7900-9
Type :
conf
DOI :
10.1109/MSMW.2010.5546144
Filename :
5546144
Link To Document :
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