DocumentCode
3501764
Title
Negative differential conductivity of semiconductor diode with resonance-tunnel border
Author
Prokhorov, E.D. ; Botsula, O.V.
Author_Institution
V. N. Karazin Kharkov Nat. Univ., Kharkov, Ukraine
fYear
2010
fDate
21-26 June 2010
Firstpage
1
Lastpage
3
Abstract
A number of semiconductor devices possess negative differential conductivity(NDC). In basis their works are tunneling, resonance tunneling, electrons capture on recombination centers or transfer of electrons in the overhead on energy of valley of conductivity zone and other. The authors propose here a novel diode, in which the NDC arise between ohmic contacts due to tunneling or resonance tunneling of electrons through the lateral scopes of diode. The current voltage characteristic of the diodes are determined.
Keywords
electron-hole recombination; ohmic contacts; semiconductor diodes; current voltage characteristics; electrons capture; negative differential conductivity; ohmic contacts; recombination centers; resonance tunnel border; resonance tunneling; semiconductor devices; semiconductor diode; Anodes; Cathodes; Conductivity; Doping; Junctions; Semiconductor diodes; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2010 International Kharkov Symposium on
Conference_Location
Kharkiv
Print_ISBN
978-1-4244-7900-9
Type
conf
DOI
10.1109/MSMW.2010.5546144
Filename
5546144
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