Title :
Evaluation of collapsing methods for fault diagnosis
Author :
Adapa, Rajsekhar ; Tragoudas, Spyros ; Michael, Maria K.
Author_Institution :
Dept. of ECE, Southern Illinois Univ., Carbondale, IL
Abstract :
This paper presents two new single stuck-at fault collapsing methods to reduce the number of tests required for fault diagnosis. The impact of the proposed collapsing methods on diagnosis is evaluated in terms of time and space requirements for the diagnosis process. Experimental comparisons on the ISCAS´85 benchmarks demonstrate the impact of the proposed generalization over the traditional fault collapsing method
Keywords :
fault diagnosis; logic testing; fault diagnosis; stuck-at fault collapsing methods; Analytical models; Benchmark testing; Cause effect analysis; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Electrical fault detection; Fault detection; Fault diagnosis;
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
DOI :
10.1109/ISQED.2006.62
