Title :
An improved method for identifying linear dependencies in path delay faults
Author :
Flanigan, E. ; Haniotakis, T. ; Tragoudas, S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL
Abstract :
The use of linear dependency relationships among path delay faults (PDFs) is an effective way to determine circuit timing characteristics. The proposed approach improves the performance of performing a linear dependency check by accelerating the Gauss elimination process. This paper presents new algorithms to represent a PDF with respect to a testable set as well as a methodology to calculate the delays of all critical sensitizable PDFs while testing only a small subset of testable PDFs. In contrast to a previous implicit method, the proposed method guarantees that each sensitizable fault can be represented as a linear combination of tested faults but its time performance can be significantly improved when combined with such implicit methods
Keywords :
Gaussian processes; fault diagnosis; logic testing; timing; Gauss elimination; circuit timing; linear combination; linear dependency relationships; path delay faults; Acceleration; Automatic testing; Circuit faults; Circuit testing; Clocks; Delay effects; Fault diagnosis; Gaussian processes; Propagation delay; Timing;
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
DOI :
10.1109/ISQED.2006.24
