DocumentCode :
3501960
Title :
Delay fault diagnosis for nonrobust test
Author :
Mehta, Vishal J. ; Wang, Zhiyuan ; Marek-Sadowska, Malgorzata ; Tsai, Kun-Han ; Rajski, Janusz
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA
fYear :
2006
fDate :
27-29 March 2006
Lastpage :
472
Abstract :
With feature sizes steadily shrinking, manufacturing defects and parameter variations often cause design timing failures. It is essential that those errors be correctly and quickly diagnosed. The existing delay-fault diagnosis algorithms cannot identify the delay faults that require nonrobust tests, because they ignore nonrobust propagation conditions while emulating the failure analyzer´s behavior. We propose a novel approach to perform delay-fault diagnosis for robust and nonrobust tests. The experimental results show that our approach can diagnose delay faults with good resolution. It is stable with respect to delay variations that the failure analyzer might experience
Keywords :
delays; fault diagnosis; integrated circuit reliability; integrated circuit testing; delay fault diagnosis; design timing failures; failure analyzer; manufacturing defects; nonrobust propagation conditions; nonrobust test; parameter variations; Algorithm design and analysis; Error correction; Failure analysis; Fault diagnosis; Manufacturing; Performance evaluation; Propagation delay; Robustness; Testing; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
Type :
conf
DOI :
10.1109/ISQED.2006.45
Filename :
1613180
Link To Document :
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