• DocumentCode
    3502014
  • Title

    An energy scavenging microsystem based on thermoelectricity for battery life extension in laptops

  • Author

    Rocha, R.P. ; Carmo, J.P. ; Goncalves, L.M. ; Correia, J.H.

  • Author_Institution
    Dept. Ind. Electron., Univ. of Minho, Guimaraes, Portugal
  • fYear
    2009
  • fDate
    3-5 Nov. 2009
  • Firstpage
    1813
  • Lastpage
    1816
  • Abstract
    This paper presents a solution to increase the nominal lifetime of batteries in laptops. New thin-film materials offer potentially greater efficiencies when converting heat to electricity using the thermoelectric effect. Applied to microprocessors, this technology can mitigate a number of critical problems as the critical amount of heat produced by laptops. The use of a thermoelectric scavenging microsystem based on the Seebeck effect can address this problem, by extracting waste heat from a high-end microprocessor, converting the heat to electricity using thin-film technology in silicon compatible materials. Applying a thermoelectric micro converter (that was fabricated using thin-films of bismuth and antimony tellurides) to a temperature gradient of 60°C, it is possible to obtain an efficiency of 3% and increase in the same amount, the lifetime of batteries.
  • Keywords
    computer power supplies; laptop computers; micromechanical devices; reliability; secondary cells; thermoelectric devices; thermoelectricity; thin films; Seebeck effect; antimony tellurides; battery life extension; bismuth; energy scavenging microsystem; laptops; microprocessors; thermoelectric microconverter; thermoelectricity; thin-film materials; waste heat; Batteries; Energy conversion; Microprocessors; Portable computers; Resistance heating; Semiconductor thin films; Silicon; Thermoelectricity; Transistors; Waste heat;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
  • Conference_Location
    Porto
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-4648-3
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2009.5414838
  • Filename
    5414838