Title :
DFM metrics for standard cells
Author_Institution :
ARM Phys. IP, Inc., Sunnyvale, CA
Abstract :
Design for manufacturability (DFM) is becoming increasingly important as process geometries shrink. Conventional design rule pass/fail is not adequate to quantify DFM compliance. Instead, metrics are needed to compare designs. Yield might be an ideal metric, but is difficult to calculate objectively without significant manufacturing data. This paper investigates the qualities that good metrics require and shows an example of an approach that seems promising
Keywords :
design for manufacture; integrated circuit design; integrated circuit manufacture; design for manufacturability metrics; manufacturing data; standard cells; Design for manufacture; Electronic equipment testing; Foundries; Geometry; Libraries; Manufacturing processes; Process design; Propagation delay; Silicon; Timing;
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
DOI :
10.1109/ISQED.2006.50
