DocumentCode
3502148
Title
Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs
Author
De Venuto, Daniela ; Reyneri, Leonardo
Author_Institution
Politecnico di Bari
fYear
2006
fDate
27-29 March 2006
Lastpage
542
Abstract
This work describes an intensive investigation on the test strategy known as polynomial fitting that uses FPGA generated stimuli for cheap and fast testing of high resolution ADCs. Simulation and experimental results showed sensitivity on the specifications parameters detection of 90 dB. The proposed method can also help to control the cost of ADC production test, extends the test coverage and enable built-in self-test and test-based self-calibration
Keywords
analogue-digital conversion; built-in self test; field programmable gate arrays; logic testing; ADC; FPGA; analog-digital converter; built-in self-test; field programmable gate arrays; polynomial fitting; test-based self-calibration; Automatic testing; Built-in self-test; Circuit testing; Field programmable gate arrays; Histograms; Linearity; Performance evaluation; Polynomials; Production; Signal generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2523-7
Type
conf
DOI
10.1109/ISQED.2006.25
Filename
1613194
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