• DocumentCode
    3502285
  • Title

    Inverse analysis of solder joint creep properties

  • Author

    Kamara, E. ; Lu, Hai-Han ; Bailey, Christopher ; Thomas, O. ; Di Maio, D. ; Hunt, C. ; Fulton, I.

  • Author_Institution
    Univ. of Greenwich, London, UK
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    275
  • Lastpage
    279
  • Abstract
    Experimental results from shear test on solder joints and Finite Element analysis method have been used to improve the creep constitutive equation for lead free SnAgCu solder alloy. Parameters in Anand´s viscoplastic model that are most sensitive to the solder joint´s stress-strain relationship have been identified and then modified in an inverse Finite Element analysis so that the new constitutive equation can be used as input data for computer simulation that predict behaviour and reliability of solder joints.
  • Keywords
    copper alloys; creep testing; finite element analysis; reliability; silver alloys; soldering; solders; stress-strain relations; tin alloys; viscoplasticity; Anand viscoplastic model; SnAgCu; computer simulation; creep constitutive equation; inverse finite element analysis; reliability; shear testing; solder joint creep property; stress-strain relationship; Analytical models; Design methodology; Instruments; Iron; Mathematical model; Simulation; Strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474617
  • Filename
    6474617