• DocumentCode
    3502502
  • Title

    MDS array codes with optimal rebuilding

  • Author

    Tamo, Itzhak ; Wang, Zhiying ; Bruck, Jehoshua

  • Author_Institution
    Electr. Eng. Dept., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2011
  • fDate
    July 31 2011-Aug. 5 2011
  • Firstpage
    1240
  • Lastpage
    1244
  • Abstract
    MDS array codes are widely used in storage systems to protect data against erasures. We address the rebuilding ratio problem, namely, in the case of erasures, what is the the fraction of the remaining information that needs to be accessed in order to rebuild exactly the lost information? It is clear that when the number of erasures equals the maximum number of erasures that an MDS code can correct then the rebuilding ratio is 1 (access all the remaining information). However, the interesting (and more practical) case is when the number of erasures is smaller than the erasure correcting capability of the code. For example, consider an MDS code that can correct two erasures: What is the smallest amount of information that one needs to access in order to correct a single erasure? Previous work showed that the rebuilding ratio is bounded between 1/2 and 3/4, however, the exact value was left as an open problem. In this paper, we solve this open problem and prove that for the case of a single erasure with a 2-erasure correcting code, the rebuilding ratio is 1/2. In general, we construct a new family of r-erasure correcting MDS array codes that has optimal rebuilding ratio of 1/r in the case of a single erasure. Our array codes have efficient encoding and decoding algorithms (for the case r = 2 they use a finite field of size 3) and an optimal update property.
  • Keywords
    error correction codes; 2-erasure correcting code; MDS array codes; optimal rebuilding; storage systems; Arrays; Bandwidth; Encoding; Frequency modulation; Maintenance engineering; Systematics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Proceedings (ISIT), 2011 IEEE International Symposium on
  • Conference_Location
    St. Petersburg
  • ISSN
    2157-8095
  • Print_ISBN
    978-1-4577-0596-0
  • Electronic_ISBN
    2157-8095
  • Type

    conf

  • DOI
    10.1109/ISIT.2011.6033733
  • Filename
    6033733