• DocumentCode
    3502503
  • Title

    Evolution of curvature under thermal cycling in sandwich assembly bonded by sintered nano-silver Paste

  • Author

    Yunjiao Cao ; Gang Chen ; Yunhui Mei ; Xin Li ; Guo-Quan Lu ; Xu Chen

  • Author_Institution
    Sch. of Chem. Eng., Tianjin Univ., Tianjin, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    310
  • Lastpage
    317
  • Abstract
    An optical measurement system was developed to study the residual curvature of sandwiched assembly bonded by three different kinds of die-attachment materials, i.e., nano-silver paste, Pb/Sn solder, and SAC305, in this paper. Effect of bondline thickness on thermal residual stress in the assembly was investigated. The curvatures of the assemblies were found significantly decreased when increasing the bondline thickness. We found that all the sandwiched assemblies at ambient temperature concave towards the alumina side and the residual bending was relieved as the temperature rose. It also turned out that the residual curvature in the assembly grew as the joint size increased. The residual bending in nano-silver assembly fell in between those of Pb/Sn solder and lead-free solder, SAC 305 (Sn96.5Ag3.0Cu0.5). The influence of temperature cycling in the range of -40°C to 125 °C on the thermal residual stress of the sintered nano-Ag was also studied. The severity of the residual curvature in all the structures was mitigated to some extent with increasing number of cycles.
  • Keywords
    assembling; bending; copper alloys; internal stresses; lead alloys; optical variables measurement; silver alloys; solders; thermal analysis; thermal stresses; tin alloys; Pb-Sn; SnAgCu; alumina side; ambient temperature concave; bondline thickness effect; die-attachment materials; nanosilver assembly; optical measurement system; residual bending; residual curvature evolution; sandwich assembly; sintered nanosilver paste; temperature -40 degC to 125 degC; temperature cycling; thermal cycling; thermal residual stress; Abstracts; Heating; Joints; Silicon; Silver;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474625
  • Filename
    6474625