• DocumentCode
    3503149
  • Title

    Investigation of competitive adsorption between accelerator and suppressor in TSV copper electroplating

  • Author

    Yue Lu ; Haiyong Cao ; Qi Sun ; Huiqin Ling ; Ming Li ; Jiangyan Sun

  • Author_Institution
    Inst. of Microelectron. Mater. & Technol., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    434
  • Lastpage
    437
  • Abstract
    In TSV copper electroplating, the goal is to achieve superfilling deposition. In order to reach the bottom-up in TSV copper electroplating, some additives (accelerator suppressor and leveler) are added into the electroplating bath. To know the relationship between additives in the plating solution is very important. In the present work, by means of linear sweep voltammetry (LSV) and cyclic voltammogram (CV), it is found that there is a competition between the accelerator and the suppressor. At the less negative potential, the accelerator shows a strong adsorption property, and the suppressor plays its role in the relatively more negative potential area, which shows a competitive adsorption relationship between the accelerator and the suppressor during the process of bottom-up filling.
  • Keywords
    adsorption; copper; electroplating; integrated circuit packaging; surge protection; three-dimensional integrated circuits; voltammetry (chemical analysis); CV; Cu; LSV; TSV copper electroplating; accelerator; adsorption property; bottom-up filling process; competitive adsorption relationship; cyclic voltammogram; electroplating bath; linear sweep voltammetry; plating solution; super-filling deposition; suppressor; Additives; Adsorption; Copper; Electric potential; Filling; Packaging; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474652
  • Filename
    6474652