Title :
Research of Measure System to Cable Insulation Parameters Based on Computer Vision
Author :
Shan, Bao-ming ; Wang, Yan-Hai ; Fan, Chun-ling
Author_Institution :
Coll. of Autom. & Electr. Eng., Qingdao Univ. of Sci. & Technol., Qingdao
Abstract :
A new method for measuring cable insulation layer parameters and its principle are presented. In order to facilitate the research of testing and measuring cable insulation layer parameters, the system based on computer vision is designed using Visual C++. After the amplification coefficient of microscope is calibrated, image is captured by CCD camera. Then, for the sake of better detecting the image edge information, non-linear median filter technology of characteristic direction is used to remove noise; at the same time, advanced and applicable Otsu method of segmentation is applied to implement background segmentation; by means of Sobel operator, the cable image edge is extracted. Finally, in order to fit the shape of cable image edge, the least square method is introduced to this system, and then cable insulation layer parameters are measured by using the amplification coefficient of microscope. The measurement system has many advantages such as more simple operation, higher degree of automation, higher precision, etc. On the basis of this measuring system, a lot of cable insulation layers were tested, and experimental results show that this system is a feasible method for measuring cable insulation parameters.
Keywords :
CCD image sensors; cable insulation; computer vision; electrical engineering computing; gain measurement; image segmentation; least squares approximations; median filters; microscopes; nonlinear filters; CCD camera; Otsu segmentation method; Sobel operator; Visual C++; background segmentation; cable insulation parameters; computer vision; least square method; microscope amplification coefficient; nonlinear median filter technology; Cable insulation; Charge coupled devices; Charge-coupled image sensors; Computer vision; Image edge detection; Image segmentation; Insulation testing; Microscopy; Shape measurement; System testing; VC++; cable insulation layer; computer vision; image measurement; parameters;
Conference_Titel :
Education Technology and Computer Science, 2009. ETCS '09. First International Workshop on
Conference_Location :
Wuhan, Hubei
Print_ISBN :
978-1-4244-3581-4
DOI :
10.1109/ETCS.2009.435