• DocumentCode
    3503247
  • Title

    Effects of cooling rate on microstructure and microhardness of lead-free Sn-3.0Ag-0.5Cu solder

  • Author

    Guoqiang Wei ; Lei Wang

  • Author_Institution
    Sch. of Mech. & Automotive Eng., South China Univ. of Technol., Guangzhou, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    453
  • Lastpage
    456
  • Abstract
    The effects of cooling rate on the microstructure and microhardness of Sn-3.0Ag-0.5Cu solder was studied. The results showed that the undercooling of the solder increases with the cooling rate increasing, resulting in eutectic composition shifting to the hypoeutectic region, thus increasing the volume ratio of the primary β-Sn and decreasing its grain size, Simultaneously, Ag3Sn in the eutectic region transforms from the large lamellar-like to uniformly distributed fine granular-like. Due to the grain refinement of the primary β-Sn and dispersion strengthening of the fine Ag3Sn in SAC305 solder, its microhardness markedly increases.
  • Keywords
    cooling; copper alloys; crystal microstructure; eutectic alloys; microhardness; silver alloys; solders; tin alloys; Sn-Ag-Cu; cooling rate effect; eutectic composition; hypoeutectic region; lead-free solder microhardness; lead-free solder microstructure; Cooling; Electronics packaging; Grain size; Lead; Mechanical factors; Microstructure; cooling rate; lead-free solder; microhardness; microstructure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474657
  • Filename
    6474657