Title :
Evaluation of semiautomated quantification of cranial ultrasound images in newborns as a predictor of Neonatal Behavioral Assessment Scale
Author :
Bonet-Carne, E. ; Tenorio, V. ; Figueras, F. ; Gratacos, E. ; Amat-Roldan, I.
Author_Institution :
TransMural Biotech, S.L., Barcelona, Spain
fDate :
March 30 2011-April 2 2011
Abstract :
Diagnosis of white matter damage by neonatal cranial ultrasound (CrUS) is subject to inter-observer variability and has a low sensitivity to detect late abnormal neurodevelopment in life. In the last decades there have been a significant effort reporting that statistical features of ultrasound images carry important information associated with changes of tissue microstructure. In this work we explored the ability of a semi-automated image processing method to associate ultrasound texture patterns with Neonatal Behavioral Assessment Scale (NBAS) performance in premature neonates. A total of ninety infants born at a median gestational age of 29 weeks were included. The infants underwent one CrUS scan performed at the same day that NBAS test. In this work, we developed a feature selection algorithm to identify combination of features that correlated to NBAS clusters. Our algorithm was then able to predict individual underscored NBAS clusters with accuracy higher than 80% in a “blind” sample.
Keywords :
biological tissues; biomedical ultrasonics; brain; feature extraction; image texture; medical image processing; neurophysiology; paediatrics; statistical analysis; cranial ultrasound images; feature selection algorithm; image processing; infants; interobserver variability; late abnormal neurodevelopment; neonatal behavioral assessment scale; newborns; semiautomated quantification; tissue microstructure; ultrasound texture patterns; white matter damage diagnosis; Biomedical imaging; Feature extraction; Pediatrics; Pixel; Training; Ultrasonic imaging; Visualization; Behavioral science; Image texture analysis; Pattern Analysis; Statistical Learning;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-4127-3
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2011.5872350