DocumentCode
3503340
Title
Suppressing effect of 1 wt.% nano-TiO2 addition into low Ag content Sn-Ag-Cu solder alloy on the intermetallic growth with Cu substrate during isothermal aging
Author
Tsao, L.C. ; Huang, W.T. ; Wu, M.W. ; Su, Shih-Tang
Author_Institution
Grad. Inst. of Mater. Eng., Nat. Pingtung Univ. of Sci. & Technol., Neipu, Taiwan
fYear
2012
fDate
13-16 Aug. 2012
Firstpage
465
Lastpage
468
Abstract
This study investigated the effects of adding 1 wt.% nano-TiO2 particles into low-Ag content Sn0.35Ag0.7Cu (SAC) lead-free solder alloys on the growth of intermetallic compounds (IMC) with Cu substrates during solid-state isothermal aging at temperatures of 125, 150, and 175°C for up to 7 days. The results indicate that the morphology of the Cu6Sn5 phase transformed from scallop-type to layer-type in low-Ag SAC composite solder/Cu joints. The growth rate of these IMCs increased with the aging temperature and time. Kinetics analyses showed that growth of the overall IMC layers was diffusion controlled. The apparent activation energies for the growth of overall IMC layers are calculated to be 50.62 kJ/mol.
Keywords
ageing; copper alloys; electronics packaging; silver alloys; solders; tin alloys; IMC; SAC lead-free solder alloys; intermetallic compounds; intermetallic growth; isothermal aging; Abstracts; Aging; Isothermal processes; Kinetic theory; Lead; Soldering;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4673-1682-8
Electronic_ISBN
978-1-4673-1680-4
Type
conf
DOI
10.1109/ICEPT-HDP.2012.6474660
Filename
6474660
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