• DocumentCode
    3503340
  • Title

    Suppressing effect of 1 wt.% nano-TiO2 addition into low Ag content Sn-Ag-Cu solder alloy on the intermetallic growth with Cu substrate during isothermal aging

  • Author

    Tsao, L.C. ; Huang, W.T. ; Wu, M.W. ; Su, Shih-Tang

  • Author_Institution
    Grad. Inst. of Mater. Eng., Nat. Pingtung Univ. of Sci. & Technol., Neipu, Taiwan
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    465
  • Lastpage
    468
  • Abstract
    This study investigated the effects of adding 1 wt.% nano-TiO2 particles into low-Ag content Sn0.35Ag0.7Cu (SAC) lead-free solder alloys on the growth of intermetallic compounds (IMC) with Cu substrates during solid-state isothermal aging at temperatures of 125, 150, and 175°C for up to 7 days. The results indicate that the morphology of the Cu6Sn5 phase transformed from scallop-type to layer-type in low-Ag SAC composite solder/Cu joints. The growth rate of these IMCs increased with the aging temperature and time. Kinetics analyses showed that growth of the overall IMC layers was diffusion controlled. The apparent activation energies for the growth of overall IMC layers are calculated to be 50.62 kJ/mol.
  • Keywords
    ageing; copper alloys; electronics packaging; silver alloys; solders; tin alloys; IMC; SAC lead-free solder alloys; intermetallic compounds; intermetallic growth; isothermal aging; Abstracts; Aging; Isothermal processes; Kinetic theory; Lead; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474660
  • Filename
    6474660